Tensile Testing Metallurgical Laboratory has access to a Scanning Electron Microscope (SEM). It scans the sample surface with a high-energy beam of electrons. Photographs with a magnification up to 25000X are available.

SEM is used extensively in failure analysis where fracture surfaces are examined to pinpoint cause of failure.

Also available is Energy Dispersive X-ray Spectroscopy (EDS) that analyze the chemical characterization of a sample. It is a quantitative analysis which can identify foreign substances on metals. Coatings on metal can also be identified through EDS.

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